Second Scanning Electron Microscope (SEM)

Due to the high demand for our instrumental analysis services and consultancy, a second SEM has been procured: a Hitachi Flex SEM 1000 Mk II Advanced Compact scanning electron microscope complete with a comprehensive Oxford Instruments AZtec energy dispersive X-ray microanalysis facility. The AZtec package installed on the new SEM includes advanced software options such as AZtec Feature and Auto Phase Map, which are particularly suited to quantifying deleterious minerals such as pyrrhotite and pyrite in concrete blocks subjected to testing in accordance with IS 465.

The new scanning electron microscope represents a valuable addition to Sandberg’s existing SU3500 SEM and significantly increases the capacity for material investigations requiring SEM analysis.

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